282 search results - page 5 / 57 » Reliability- and process-variation aware design of integrate... |
Publication
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
DAC
2009
ACM
14 years 8 months ago
2009
ACM
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...
ISLPED
2006
ACM
14 years 1 months ago
2006
ACM
Process variations will increasingly impact the operational characteristics of integrated circuits in nanoscale semiconductor technologies. Researchers have proposed various desig...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
Electrothermal couplings between supply voltage, operating frequency, power dissipation and die temperature have been shown to significantly impact the energy-delay-product (EDP) ...
DAC
2009
ACM
14 years 2 months ago
2009
ACM
It is unknown how to include stochastic process variation into fast-multipole-method (FMM) for a full chip capacitance extraction. This paper presents a parallel FMM extraction us...