282 search results - page 6 / 57 » Reliability- and process-variation aware design of integrate... |
TCAD
2008
13 years 7 months ago
2008
Abstract--Advances in very large-scale integration technology make clock skew more susceptible to process variations. Notwithstanding efficient exact zero-skew algorithms, clock sk...
DAC
2012
ACM
11 years 10 months ago
2012
ACM
Large-scale process variations can significantly limit the practical utility of microelectro-mechanical systems (MEMS) for RF (radio frequency) applications. In this paper we desc...
GLVLSI
2006
IEEE
14 years 1 months ago
2006
IEEE
Process variations have become a key concern of circuit designers because of their significant, yet hard to predict impact on performance and signal integrity of VLSI circuits. St...
GLVLSI
2009
IEEE
13 years 11 months ago
2009
IEEE
In this paper, we present the design of a P4 (Power-PerformanceProcess-Parasitic) aware voltage controlled oscillator (VCO) at nanoCMOS technologies. Through simulations, we have ...
ASPDAC
2010
ACM
13 years 5 months ago
2010
ACM
The concept of having an integrated circuit (IC) generate its own unique digital signature has broad application in areas such as embedded systems security, and IP/IC counterpiracy...