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VTS
2002
IEEE
109views Hardware» more  VTS 2002»
14 years 15 hour ago
Controlling Peak Power During Scan Testing
This paper presents a procedure for modifying a given set of scan vectors so that the peak power during scan testing is kept below a specified limit without reducing fault coverag...
Ranganathan Sankaralingam, Nur A. Touba
SPAA
2005
ACM
14 years 20 days ago
Efficient algorithms for verifying memory consistency
One approach in verifying the correctness of a multiprocessor system is to show that its execution results comply with the memory consistency model it is meant to implement. It ha...
Chaiyasit Manovit, Sudheendra Hangal
ICCAD
2000
IEEE
77views Hardware» more  ICCAD 2000»
13 years 11 months ago
Improving the Proportion of At-Speed Tests in Scan BIST
A method to select the lengths of functional sequences in a BIST scheme for scan designs is proposed in this paper. A functional sequence is a sequence of primary input vectors ap...
Yu Huang, Irith Pomeranz, Sudhakar M. Reddy, Janus...
FCCM
2000
IEEE
122views VLSI» more  FCCM 2000»
13 years 11 months ago
Evaluating Hardware Compilation Techniques
Hardware compilation techniques which use highlevel programming languages to describe and synthesize hardware are gaining popularity. They are especially useful for reconfigurable...
Markus Weinhardt, Wayne Luk
ICCD
1999
IEEE
93views Hardware» more  ICCD 1999»
13 years 11 months ago
Using an Embedded Processor for Efficient Deterministic Testing of Systems-on-a-Chip
If a system-on-a-chip (SOC) contains an embedded processor, this paper presents a novel approach for using the processor to aid in testing the other components of the SOC. The bas...
Abhijit Jas, Nur A. Touba