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DATE
2005
IEEE
115views Hardware» more  DATE 2005»
15 years 10 months ago
Functional Coverage Driven Test Generation for Validation of Pipelined Processors
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
Prabhat Mishra, Nikil D. Dutt
JCS
2011
156views more  JCS 2011»
14 years 11 months ago
Securing low-cost RFID systems: An unconditionally secure approach
We explore a new direction towards solving the identity authentication problem in RFID systems. We break the RFID authentication process into two main problems: message authenticat...
Basel Alomair, Loukas Lazos, Radha Poovendran
ATS
2000
IEEE
145views Hardware» more  ATS 2000»
15 years 8 months ago
Compaction-based test generation using state and fault information
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwa...
NPL
2007
109views more  NPL 2007»
15 years 3 months ago
Generative Modeling of Autonomous Robots and their Environments using Reservoir Computing
Autonomous mobile robots form an important research topic in the field of robotics due to their near-term applicability in the real world as domestic service robots. These robots ...
Eric A. Antonelo, Benjamin Schrauwen, Jan M. Van C...
IJCNN
2008
IEEE
15 years 10 months ago
Dataset complexity can help to generate accurate ensembles of k-nearest neighbors
— Gene expression based cancer classification using classifier ensembles is the main focus of this work. A new ensemble method is proposed that combines predictions of a small ...
Oleg Okun, Giorgio Valentini