303 search results - page 19 / 61 » Robust Test Generation and Coverage for Hybrid Systems |
ICCAD
2010
IEEE
13 years 5 months ago
2010
IEEE
Extreme technology scaling in silicon devices drastically affects reliability, particularly because of runtime failures induced by transistor wearout. Currently available online t...
UML
2004
Springer
14 years 1 months ago
2004
Springer
We describe the tools and interfaces created by the AGEDIS project, a European Commission sponsored project for the creation of a methodology and tools for automated model driven ...
MM
2005
ACM
14 years 1 months ago
2005
ACM
We propose IMAGINATION (IMAge Generation for INternet AuthenticaTION), a system for the generation of attack-resistant, user-friendly, image-based CAPTCHAs. In our system, we prod...
ITC
1991
IEEE
13 years 11 months ago
1991
IEEE
Two approaches have been used to balance the cost of generating e ective tests for ICs and the need to increase the ICs' quality level. The rst approach favorsusing high-leve...
ISSRE
2003
IEEE
14 years 29 days ago
2003
IEEE
Use-cases and scenarios have been identified as good inputs to generate test cases and oracles at requirement level. Yet to have an automated generation, information is missing f...