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ICSE
2005
IEEE-ACM
14 years 9 months ago
Use of relative code churn measures to predict system defect density
Software systems evolve over time due to changes in requirements, optimization of code, fixes for security and reliability bugs etc. Code churn, which measures the changes made to...
Nachiappan Nagappan, Thomas Ball
VISSYM
2007
13 years 11 months ago
Parametric Visualization of High Resolution Correlated Multi-spectral Features Using PCA
An imaging mass spectrometer is an analytical instrument that can determine the spatial distribution of chemical compounds on complex surfaces. The output of the device is a multi...
Alexander Broersen, Robert van Liere, Ron M. A. He...
CVPR
2012
IEEE
11 years 11 months ago
Hierarchical face parsing via deep learning
This paper investigates how to parse (segment) facial components from face images which may be partially occluded. We propose a novel face parser, which recasts segmentation of fa...
Ping Luo, Xiaogang Wang, Xiaoou Tang
CLUSTER
2007
IEEE
14 years 3 months ago
Anomaly localization in large-scale clusters
— A critical problem facing by managing large-scale clusters is to identify the location of problems in a system in case of unusual events. As the scale of high performance compu...
Ziming Zheng, Yawei Li, Zhiling Lan
AIPR
2003
IEEE
14 years 2 months ago
Eigenviews for Object Recognition in Multispectral Imaging Systems
We address the problem of representing multispectral images of objects using eigenviews for recognition purposes. Eigenviews have long been used for object recognition and pose es...
Rajeev Ramanath, Wesley E. Snyder, Hairong Qi