768 search results - page 16 / 154 » Robustness of Sequential Circuits |
VLSID
1997
IEEE
14 years 1 months ago
1997
IEEE
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...
DAC
1995
ACM
14 years 15 days ago
1995
ACM
Retiming has been proposed as an optimizationstep forsequential circuits represented at the net-list level. Retiming moves the latches across the logic gates and in doing so chang...
DATE
2005
IEEE
14 years 2 months ago
2005
IEEE
1 The first path implicit and exact non–robust path delay fault grading technique for non–scan sequential circuits is presented. Non enumerative exact coverage is obtained, b...
TCAD
1998
13 years 8 months ago
1998
—New methods for fault-effect propagation and state justification that use finite-state-machine sequences are proposed for sequential circuit test generation. Distinguishing se...
VLSID
2005
IEEE
14 years 9 months ago
2005
IEEE
We propose a novel, non-simulative, probabilistic model for switching activity in sequential circuits, capturing both spatio-temporal correlations at internal nodes and higher ord...