768 search results - page 78 / 154 » Robustness of Sequential Circuits |
AHS
2006
IEEE
14 years 16 days ago
2006
IEEE
A new hardware developmental model that shows strong robust transient fault-tolerant abilities and is motivated by embryonic development and a honeycomb structure is presented. Ca...
ETS
2009
IEEE
2009
IEEE
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques
13 years 6 months ago
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
GW
2005
Springer
14 years 2 months ago
2005
Springer
In modern society there is an increasing demand to access, record and manipulate large amounts of information. This has inspired a new approach to thinking about and designing pers...
ASPDAC
2005
ACM
13 years 10 months ago
2005
ACM
As the minimum feature sizes of VLSI circuits get smaller while the clock frequency increases, the effects of process variations become significant. We propose a UST/DME based ap...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
We define a robust fault model as a model where the existence of an undetectable fault implies the existence of logic redundancy, or more generally, a suboptimality in the synthe...