This work focuses on developing systems of blocks in SIMULINK and VHDL to reuse on design of applications involving the recognition of polygonal objects. Usage of this work reduce...
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
Many scientific simulations are large programs which despite careful debugging and testing will probably contain errors when deployed to the Web for use. Based on the assumption ...
This paper presents a novel and fast k-NN classifier that is based on a binary CMM (Correlation Matrix Memory) neural network. A robust encoding method is developed to meet CMM in...
In this article, a new model to simulate different failure propagation scenarios in GMPLS-based networks is proposed. Several types of failures and malfunctions may spread along t...
Eusebi Calle, J. Ripoll, J. Segovia, Pere Vil&agra...