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ICCAD
2002
IEEE
161views Hardware» more  ICCAD 2002»
14 years 5 months ago
Non-tree routing for reliability and yield improvement
We propose to introduce redundant interconnects for manufacturing yield and reliability improvement. By introducing redundant interconnects, the potential for open faults is reduc...
Andrew B. Kahng, Bao Liu, Ion I. Mandoiu
WWW
2010
ACM
14 years 3 months ago
Atomate it! end-user context-sensitive automation using heterogeneous information sources on the web
The transition of personal information management (PIM) tools off the desktop to the Web presents an opportunity to augment these tools with capabilities provided by the wealth o...
Max Van Kleek, Brennan Moore, David R. Karger, Pau...
CGO
2010
IEEE
14 years 3 months ago
Linear scan register allocation on SSA form
The linear scan algorithm for register allocation provides a good register assignment with a low compilation overhead and is thus frequently used for just-in-time compilers. Altho...
Christian Wimmer, Michael Franz
IPSN
2010
Springer
14 years 3 months ago
KleeNet: discovering insidious interaction bugs in wireless sensor networks before deployment
Complex interactions and the distributed nature of wireless sensor networks make automated testing and debugging before deployment a necessity. A main challenge is to detect bugs ...
Raimondas Sasnauskas, Olaf Landsiedel, Muhammad Ha...
DAC
2009
ACM
14 years 3 months ago
Clock skew optimization via wiresizing for timing sign-off covering all process corners
Manufacturing process variability impacts the performance of synchronous logic circuits by means of its effect on both clock network and functional block delays. Typically, varia...
Sari Onaissi, Khaled R. Heloue, Farid N. Najm