Test pattern decompression techniques are bounded with the algorithm of test pattern ordering and test data flow controlling. Some of the methods could have more sophisticated sor...
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
Saeed Safari, Amir-Hossein Jahangir, Hadi Esmaeilz...
With aggressive reductions in feature sizes and the integration of multiple functionalities on the same die, bottlenecks due to I/O pin limitations have become a severe issue in to...
1 The objective of this paper is to propose a new fault model suitable for test pattern generation for an FPGA configured to implement a given application. The paper demonstrates t...
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
Michael A. Kochte, Marcel Schaal, Hans-Joachim Wun...