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» SEU tolerant device, circuit and processor design
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CODES
2008
IEEE
13 years 9 months ago
Design and defect tolerance beyond CMOS
It is well recognized that novel computational models, devices and technologies are needed in order to sustain the remarkable advancement of CMOS-based VLSI circuits and systems. ...
Xiaobo Sharon Hu, Alexander Khitun, Konstantin K. ...
ISQED
2007
IEEE
116views Hardware» more  ISQED 2007»
14 years 1 months ago
MEMESTAR: A Simulation Framework for Reliability Evaluation over Multiple Environments
We present a methodology for the simulation of soft errors targeting future nano-technological devices. This approach efficiently scales the failure rate of individual devices ac...
Christian J. Hescott, Drew C. Ness, David J. Lilja
QEST
2010
IEEE
13 years 5 months ago
On the Theory of Stochastic Processors
Traditional architecture design approaches hide hardware uncertainties from the software stack through overdesign, which is often expensive in terms of power consumption. The recen...
Parasara Sridhar Duggirala, Sayan Mitra, Rakesh Ku...
ISLPED
2006
ACM
129views Hardware» more  ISLPED 2006»
14 years 1 months ago
Variation-driven device sizing for minimum energy sub-threshold circuits
Sub-threshold operation is a compelling approach for energyconstrained applications, but increased sensitivity to variation must be mitigated. We explore variability metrics and t...
Joyce Kwong, Anantha P. Chandrakasan
BCS
2008
13 years 9 months ago
Hardware Dependability in the Presence of Soft Errors
Using formal verification for designing hardware designs free from logic design bugs has been an active area of research since the last 15 years. Technology has matured and we hav...
Ashish Darbari, Bashir M. Al-Hashimi