MEMESTAR: A Simulation Framework for Reliability Evaluation over Multiple Environments

We present a methodology for the simulation of soft errors targeting future nano-technological devices. This approach efficiently scales the failure rate of individual devices according to cell area and considers the effect of multiple faults within a circuit. Furthermore this methodology measures circuit operation over a range of environments and consequently provides a means of targeting designs to the expected operating environment rather than worst case. We demonstrate the effect area has on circuit reliability and fault tolerance.

• Type: Conference
• Year: 2007
• Where: ISQED
• Authors: Christian J. Hescott, Drew C. Ness, David J. Lilja
• Keywords: Circuit Reliability, Future Nano-technological Devices, Hardware, ISQED 2007, Methodology Measures Circuit