1336 search results - page 14 / 268 » SMTP Path Analysis |
VLSID
2000
IEEE
14 years 1 days ago
2000
IEEE
We consider the problem of timing analysis in the presence of known false paths. The main difficulty in adaptation of classical breadth-first search to the problem is that at each...
ISLPED
1995
ACM
13 years 11 months ago
1995
ACM
Prompted by demands for portability and low-cost packaging, the electronics industry has begun to view power consumption as a critical design criteria. As such there is a growing ...
TCAD
2008
13 years 7 months ago
2008
Abstract--The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer-circuit design. High voltages that resulted from ESD might cause high cu...
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
WSOM
2009
Springer
14 years 2 months ago
2009
Springer
Abstract. This paper is devoted to the analysis of career paths and employability. The state-of-the-art on this topic is rather poor in methodologies. Some authors propose distance...