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DATE
2005
IEEE
107views Hardware» more  DATE 2005»
14 years 3 months ago
On Statistical Timing Analysis with Inter- and Intra-Die Variations
In this paper, we highlight a fast, effective and practical statistical approach that deals with inter and intra-die variations in VLSI chips. Our methodology is applied to a numb...
Hratch Mangassarian, Mohab Anis
ITC
2000
IEEE
74views Hardware» more  ITC 2000»
14 years 2 months ago
A good excuse for reuse: "open" TAP controller design
In this paper we present a design for IEEE 1149.1 Test Access Port (TAP)controllers that is based on a practical reuse methodology. While the basic use and core functionality of T...
David B. Lavo
KBSE
2010
IEEE
13 years 8 months ago
MiTV: multiple-implementation testing of user-input validators for web applications
User-input validators play an essential role in guarding a web application against application-level attacks. Hence, the security of the web application can be compromised by defe...
Kunal Taneja, Nuo Li, Madhuri R. Marri, Tao Xie, N...
STVR
2002
111views more  STVR 2002»
13 years 9 months ago
Can fault-exposure-potential estimates improve the fault detection abilities of test suites?
Code-coverage-based test data adequacy criteria typically treat all coverable code elements (such as statements, basic blocks, or outcomes of decisions) as equal. In practice, how...
Wei Chen, Roland H. Untch, Gregg Rothermel, Sebast...
WWW
2011
ACM
13 years 4 months ago
Network bucket testing
Bucket testing, also known as A/B testing, is a practice that is widely used by on-line sites with large audiences: in a simple version of the methodology, one evaluates a new fea...
Lars Backstrom, Jon M. Kleinberg