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ICCAD
2005
IEEE
176views Hardware» more  ICCAD 2005»
16 years 1 months ago
Statistical gate sizing for timing yield optimization
— Variability in the chip design process has been relatively increasing with technology scaling to smaller dimensions. Using worst case analysis for circuit optimization severely...
Debjit Sinha, Narendra V. Shenoy, Hai Zhou
ASPDAC
2006
ACM
137views Hardware» more  ASPDAC 2006»
15 years 10 months ago
Parameterized block-based non-gaussian statistical gate timing analysis
As technology scales down, timing verification of digital integrated circuits becomes an increasingly challenging task due to the gate and wire variability. Therefore, statistical...
Soroush Abbaspour, Hanif Fatemi, Massoud Pedram
CCGRID
2004
IEEE
15 years 8 months ago
Predicting job start times on clusters
In a Computational Grid which consists of many computer clusters, job start time predictions are useful to guide resource selections and balance the workload distribution. However...
Hui Li, David L. Groep, Jeffrey Templon, Lex Wolte...
ICDE
2005
IEEE
185views Database» more  ICDE 2005»
16 years 6 months ago
A Multiresolution Symbolic Representation of Time Series
Efficiently and accurately searching for similarities among time series and discovering interesting patterns is an important and non-trivial problem. In this paper, we introduce a...
Vasileios Megalooikonomou, Qiang Wang, Guo Li, Chr...
ICCAD
2003
IEEE
115views Hardware» more  ICCAD 2003»
16 years 1 months ago
Efficient Verification of Hazard-Freedom in Gate-Level Timed Asynchronous Circuits
This paper presents an efficient method for verifying hazard freedom in timed asynchronous circuits. Timed circuits are a class of asynchronous circuits that utilize explicit tim...
Curtis A. Nelson, Chris J. Myers, Tomohiro Yoneda