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    LREC
    2010
    166views Education» more  LREC 2010»
    Learning Based Java for Rapid Development of NLP Systems
    13 years 9 months ago
    Learning Based Java for Rapid Development of NLP Systems
    Download  l2r.cs.uiuc.edu
    Today's natural language processing systems are growing more complex with the need to incorporate a wider range of language resources and more sophisticated statistical metho...
    Nick Rizzolo, Dan Roth
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    JMLR
    2008
    230views more  JMLR 2008»
    Exponentiated Gradient Algorithms for Conditional Random Fields and Max-Margin Markov Networks
    13 years 7 months ago
    Exponentiated Gradient Algorithms for Conditional Random Fields and Max-Margin Markov Networks
    Download  www.stat.berkeley.edu
    Log-linear and maximum-margin models are two commonly-used methods in supervised machine learning, and are frequently used in structured prediction problems. Efficient learning of...
    Michael Collins, Amir Globerson, Terry Koo, Xavier...
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    VLDB
    2002
    ACM
    108views Database» more  VLDB 2002»
    Generic Database Cost Models for Hierarchical Memory Systems
    13 years 7 months ago
    Generic Database Cost Models for Hierarchical Memory Systems
    Download  www.vldb.org
    Accurate prediction of operator execution time is a prerequisite for database query optimization. Although extensively studied for conventional disk-based DBMSs, cost modeling in ...
    Stefan Manegold, Peter A. Boncz, Martin L. Kersten
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    IJMMS
    2007
    116views more  IJMMS 2007»
    Modeling and evaluating empathy in embodied companion agents
    13 years 7 months ago
    Modeling and evaluating empathy in embodied companion agents
    Download  research.csc.ncsu.edu
    Affective reasoning plays an increasingly important role in cognitive accounts of social interaction. Humans continuously assess one another's situational context, modify the...
    Scott W. McQuiggan, James C. Lester
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    DAC
    2007
    ACM
    151views Computer Architecture» more  DAC 2007»
    Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
    14 years 8 months ago
    Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
    Download  www.gigascale.org
    Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
    Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
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