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GLVLSI
1997
IEEE
131views VLSI» more  GLVLSI 1997»
13 years 11 months ago
Analog Circuit Model of Lamprey Unit Pattern Generator
Elizabeth J. Brauer, Ranu Jung, Denise M. Wilson, ...
SAC
1997
ACM
13 years 11 months ago
SAARA: a simulated annealing algorithm for test pattern generation for digital circuits
Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo,...
ITC
1994
IEEE
136views Hardware» more  ITC 1994»
13 years 11 months ago
An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms
Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza ...