The paper proposes a novel approach in an attempt to solve the test problem for sequential circuits. Up until now, most of the classical test pattern techniques use a number of al...
The paper presents a test pattern generation and fault simulation methodology for the detection of catastrophic faults in analogue circuits. The test methodology chosen for evalua...
Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Ma...
Due to the development of high speed circuits beyond the 2-GHz mark, the significance of automatic test pattern generation for Path Delay Faults (PDFs) drastically increased in t...
In recent years, wireless communications, such as wireless LAN and Bluetooth, are widely spreading. As the antennas used in wireless communications are usually installed in small ...
Hirotaka Furuya, Ning Guan, Kuniharu Himeno, Koich...
We consider the Goldberg-Coxeter construction GCk,l(G0) (a generalization of a simplicial subdivision of the dodecahedron considered in [Gold37] and [Cox71]), which produces a pla...