376 search results - page 36 / 76 » Self-Assembled Circuit Patterns |
SLIP
2009
ACM
14 years 2 months ago
2009
ACM
Double patterning lithography seems to be a prominent choice for 32nm and 22nm technologies. Double patterning lithography techniques require additional masks for a single interco...
DATE
2003
IEEE
14 years 27 days ago
2003
IEEE
Test pattern decompression techniques are bounded with the algorithm of test pattern ordering and test data flow controlling. Some of the methods could have more sophisticated sor...
AINA
2010
IEEE
14 years 14 days ago
2010
IEEE
—Network Intrusion Detection System (NIDS) is a system which can detect network attacks resulted from worms and viruses on the Internet. An efficient pattern matching algorithm p...
ITC
1995
IEEE
13 years 11 months ago
1995
IEEE
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
CASES
2009
ACM
14 years 9 days ago
2009
ACM
Nanowire crossbar circuits are an emerging architectural paradigm that promises a higher integration density and an improved fault-tolerance due to its reconfigurability. In this...