376 search results - page 39 / 76 » Self-Assembled Circuit Patterns |
MEMOCODE
2007
IEEE
14 years 1 months ago
2007
IEEE
Due to the rapidly growing speed and the decreasing size of gates in modern chips, the probability of faults caused by the production process grows. Already small variations lead ...
BC
2008
13 years 7 months ago
2008
Abstract This paper presents a simple yet biologicallygrounded model for the neural control of Caenorhabditis elegans forward locomotion. We identify a minimal circuit within the C...
IOLTS
2008
IEEE
14 years 2 months ago
2008
IEEE
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
DAC
1994
ACM
13 years 11 months ago
1994
ACM
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...
DT
2007
13 years 7 months ago
2007
This paper proposes a new heuristic approach to determine the input pattern that minimizes leakage currents of nanometer CMOS circuits during sleep mode considering stack and fano...