376 search results - page 52 / 76 » Self-Assembled Circuit Patterns |
AHS
2006
IEEE
13 years 11 months ago
2006
IEEE
A new hardware developmental model that shows strong robust transient fault-tolerant abilities and is motivated by embryonic development and a honeycomb structure is presented. Ca...
DFT
2004
IEEE
13 years 11 months ago
2004
IEEE
In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generat...
HIPEAC
2011
Springer
12 years 7 months ago
2011
Springer
In chip multiprocessors (CMPs), data accesslatency dependson the memory hierarchy organization, the on-chip interconnect (NoC), and the running workload. Reducing data access late...
IPPS
2008
IEEE
14 years 2 months ago
2008
IEEE
Enabling circuit switching in multiprocessor systems has the potential to achieve more efficient communication with lower cost compared to packet/wormhole switching. However, in ...
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...