376 search results - page 7 / 76 » Self-Assembled Circuit Patterns |
CASES
2001
ACM
13 years 11 months ago
2001
ACM
We describe a digital circuit synthesis algorithm specialized for the domain of pattern matching circuits implemented in reconfigurable logic. We propose to use this algorithm as ...
TC
2008
13 years 7 months ago
2008
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...
ICCAD
1998
IEEE
13 years 11 months ago
1998
IEEE
In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...
ICCAD
1991
IEEE
13 years 11 months ago
1991
IEEE
This paper presents an efficient algorithm for the generation of diagnostic test patterns which distinguish between two arbitrary single stuck-at faults. The algorithm is able to ...
ITC
1994
IEEE
13 years 11 months ago
1994
IEEE
Previous approaches to designing random pattern testable circuits use post-synthesis test point insertion to eliminate random pattern resistant (r.p.r.) faults. The approach taken...