1287 search results - page 209 / 258 » Self-Normalized Linear Tests |
GD
2004
Springer
14 years 2 months ago
2004
Springer
We use Schnyder woods of 3-connected planar graphs to produce convex straight line drawings on a grid of size (n − 2 − ∆) × (n − 2 − ∆). The parameter ∆ ≥ 0 depen...
DATE
2003
IEEE
14 years 2 months ago
2003
IEEE
Data correlation is a well-known problem that causes difficulty in VLSI testing. Based on a correlation metric, an efficient heuristic to select BIST registers has been proposed...
ICCAD
2003
IEEE
14 years 2 months ago
2003
IEEE
Process variations have become a critical issue in performance verification of high-performance designs. We present a new, statistical timing analysis method that accounts for int...
FGR
2002
IEEE
14 years 2 months ago
2002
IEEE
In this paper, we present a scheme for face authentication in the presence of variations. To deal with variations, such as facial expressions and registration errors, with which t...
CIKM
1999
Springer
14 years 1 months ago
1999
Springer
Prior work has shown that combining results of various retrieval approaches and query representations can improve search effectiveness. Today, many meta-search engines exist which...