1287 search results - page 27 / 258 » Self-Normalized Linear Tests |
ATS
2009
IEEE
14 years 2 months ago
2009
IEEE
—A method of testing for parametric faults of analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit...
DFT
2005
IEEE
14 years 1 months ago
2005
IEEE
In this paper, we propose a system-level error tolerance scheme for systems where a linear transform is combined with quantization. These are key components in multimedia compress...
ICCD
2002
IEEE
14 years 20 days ago
2002
IEEE
Concurrent detection of failures in analog circuits is becoming increasingly more important as safety-critical systems become more widespread. A methodology for the automatic desi...
STOC
2004
ACM
14 years 8 months ago
2004
ACM
Abstract. In the late nineties, Erickson proved a remarkable lower bound on the decision tree complexity of one of the central problems of computational geometry: given n numbers, ...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
It has been shown that the delay of a target path can be composed linearly of other path delays. If the later paths are robustly testable (with known delay values), the target pat...