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STOC
1991
ACM
84views Algorithms» more  STOC 1991»
13 years 11 months ago
Self-Testing/Correcting for Polynomials and for Approximate Functions
The study of self-testing/correcting programs was introduced in [8] in order to allow one to use program P to compute function f without trusting that P works correctly. A self-te...
Peter Gemmell, Richard J. Lipton, Ronitt Rubinfeld...
AAECC
2006
Springer
120views Algorithms» more  AAECC 2006»
13 years 7 months ago
Continued fraction for formal laurent series and the lattice structure of sequences
Abstract Besides equidistribution properties and statistical independence the lattice profile, a generalized version of Marsaglia's lattice test, provides another quality meas...
Wilfried Meidl
ITC
2000
IEEE
84views Hardware» more  ITC 2000»
13 years 11 months ago
Non-intrusive BIST for systems-on-a-chip
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
Silvia Chiusano, Paolo Prinetto, Hans-Joachim Wund...
PLDI
2012
ACM
11 years 10 months ago
Fully automatic and precise detection of thread safety violations
Concurrent, object-oriented programs often use thread-safe library classes. Existing techniques for testing a thread-safe class either rely on tests using the class, on formal spe...
Michael Pradel, Thomas R. Gross
DATE
2006
IEEE
102views Hardware» more  DATE 2006»
14 years 1 months ago
Pseudorandom functional BIST for linear and nonlinear MEMS
Pseudorandom test techniques are widely used for measuring the impulse response (IR) for linear devices and Volterra kernels for nonlinear devices, especially in the acoustics dom...
Achraf Dhayni, Salvador Mir, Libor Rufer, Ahc&egra...