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FOCS
2002
IEEE
14 years 22 days ago
A Lower Bound for Testing 3-Colorability in Bounded-Degree Graphs
We consider the problem of testing 3-colorability in the bounded-degree model. We show that, for small enough ε, every tester for 3colorability must have query complexity Ω(n)....
Andrej Bogdanov, Kenji Obata, Luca Trevisan
ISCAS
2005
IEEE
100views Hardware» more  ISCAS 2005»
14 years 1 months ago
A test strategy for time-to-digital converters using dynamic element matching and dithering
This work presents a cost-effective test structure that is applicable to built-in self-test of time-to-digital converters (TDCs). The proposed structure uses deterministic dynamic ...
Wenbo Liu, Hanqing Xing, Le Jin, Randall L. Geiger...
DATE
2000
IEEE
110views Hardware» more  DATE 2000»
14 years 6 days ago
A BIST Scheme for On-Chip ADC and DAC Testing
In this paper, we present a BIST scheme for testing onchip AD and DA converters. We discuss on-chip generation of linear ramps as test stimuli, and propose techniques for measurin...
Jiun-Lang Huang, Chee-Kian Ong, Kwang-Ting Cheng
CADE
2002
Springer
14 years 8 months ago
Testing Satisfiability of CNF Formulas by Computing a Stable Set of Points
We show that a conjunctive normal form (CNF) formula F is unsatisfiable iff there is a set of points of the Boolean space that is stable with respect to F. So testing the satisfiab...
Eugene Goldberg
ICASSP
2008
IEEE
14 years 2 months ago
Composite hypothesis testing by optimally distinguishable distributions
Relying on optimally distinguishable distributions (ODD), it was defined very recently a new framework for the composite hypothesis testing. We resort to the linear model to inve...
Seyed Alireza Razavi, Ciprian Doru Giurcaneanu