1287 search results - page 5 / 258 » Self-Normalized Linear Tests |
IEICET
2010
13 years 6 months ago
2010
MOC
2000
13 years 7 months ago
2000
We consider sequences of s
DAGSTUHL
2007
13 years 9 months ago
2007
In this paper we give the first deterministic polynomial time algorithm for testing whether a diagonal depth-3 circuit C(x1, . . . , xn) (i.e. C is a sum of powers of linear funct...
VTS
1995
IEEE
13 years 11 months ago
1995
IEEE
Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
ICCAD
1994
IEEE
13 years 11 months ago
1994
IEEE
This paper proposes a test approach and circuitry suitable for built-in self-test (BIST) of digital-to-analog (D/A) and analog-to-digital (A/D) converters. Offset, gain, linearity...