A new built-in self-test approach for digital-to-analog and analog-to-digital converters

This paper proposes a test approach and circuitry suitable for built-in self-test (BIST) of digital-to-analog (D/A) and analog-to-digital (A/D) converters. Offset, gain, linearity and differential linearity errors are tested without using test equipment. The proposed BIST structure decreases the test cost and test time. The BIST circuitry has been designed to D/A and A/D converters

• Type: Conference
• Year: 1994
• Where: ICCAD
• Authors: Karim Arabi, Bozena Kaminska, Janusz Rzeszut
• Keywords: BIST Circuitry, BIST Structure, Hardware, ICCAD 1994, Test Approach