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DDECS
2007
IEEE
175views Hardware» more  DDECS 2007»
14 years 5 months ago
Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair
—An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. A commonly used repair strategy is to equip memories with sp...
Philipp Öhler, Sybille Hellebrand, Hans-Joach...
SIGMETRICS
2010
ACM
213views Hardware» more  SIGMETRICS 2010»
14 years 4 months ago
Small subset queries and bloom filters using ternary associative memories, with applications
Associative memories offer high levels of parallelism in matching a query against stored entries. We design and analyze an architecture which uses a single lookup into a Ternary C...
Ashish Goel, Pankaj Gupta
SIGMOD
2010
ACM
324views Database» more  SIGMOD 2010»
14 years 4 months ago
Similarity search and locality sensitive hashing using ternary content addressable memories
Similarity search methods are widely used as kernels in various data mining and machine learning applications including those in computational biology, web search/clustering. Near...
Rajendra Shinde, Ashish Goel, Pankaj Gupta, Debojy...
HPCA
2011
IEEE
13 years 2 months ago
Essential roles of exploiting internal parallelism of flash memory based solid state drives in high-speed data processing
Flash memory based solid state drives (SSDs) have shown a great potential to change storage infrastructure fundamentally through their high performance and low power. Most recent ...
Feng Chen, Rubao Lee, Xiaodong Zhang
SIGMOD
2009
ACM
213views Database» more  SIGMOD 2009»
14 years 11 months ago
Dictionary-based order-preserving string compression for main memory column stores
Column-oriented database systems [19, 23] perform better than traditional row-oriented database systems on analytical workloads such as those found in decision support and busines...
Carsten Binnig, Stefan Hildenbrand, Franz Fär...