38 search results - page 4 / 8 » Shrinking Reductions in SML.NET |
VLSID
2005
IEEE
14 years 11 months ago
2005
IEEE
: The direct result of shrinking devices is not only higher densities but also increased switching activity and thus higher device temperatures. The variation in temperature over t...
ICCD
2003
IEEE
14 years 7 months ago
2003
IEEE
Continued advancements in fabrication technology and reductions in feature size create challenges in maintaining both manufacturing yield rates and long-term reliability of device...
VLSI
2005
Springer
14 years 4 months ago
2005
Springer
Leakage power consumption of current CMOS technology is already a great challenge. ITRS projects that leakage power consumption may come to dominate total chip power consumption a...
DPHOTO
2009
13 years 8 months ago
2009
As the number of imaging pixels in camera phones increases, users expect camera phone image quality to be comparable to digital still cameras. The mobile imaging industry is aware...
ICIP
2009
IEEE
14 years 12 months ago
2009
IEEE
We present a novel and efficient multi-view depth map enhancement method proposed as a post-processing of initially estimated depth maps. The proposed method is based on edge, mot...