42 search results - page 3 / 9 » Signature Rollback - A Technique for Testing Robust Circuits |
ISCAS
2007
IEEE
14 years 1 months ago
2007
IEEE
Due to the development of high speed circuits beyond the 2-GHz mark, the significance of automatic test pattern generation for Path Delay Faults (PDFs) drastically increased in t...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
ICCAD
2007
IEEE
14 years 3 months ago
2007
IEEE
— Determination of maximum operating frequencies (Fmax) during manufacturing test at different operating voltages is required to: (a) to ensure that, for a Dynamic Voltage and Fr...
VTS
2002
IEEE
13 years 12 months ago
2002
IEEE
Single-bit second-order delta-sigma modulators are commonly used in high-resolution ADCs. Testing this type of modulator requires a high-resolution test stimulus, which is diffic...
VLSID
2002
IEEE
14 years 7 months ago
2002
IEEE
Deep submicron technology calls for new design techniques, in which wire and gate delays are accounted to have equal or nearly equal effect on circuit behavior. Asynchronous speed...