46 search results - page 6 / 10 » Simplest Chaotic Circuit |
IJBC
2002
13 years 9 months ago
2002
NECO
1998
13 years 9 months ago
1998
IJBC
2010
13 years 7 months ago
2010
DFT
2002
IEEE
14 years 2 months ago
2002
IEEE
Concurrent error detection (CED) methods are typically employed to provide an indication of the operational health of synchronous circuits during normal functionality. Existing CE...
CORR
2007
Springer
13 years 9 months ago
2007
Springer
: New nanotechnology based devices are replacing CMOS devices to overcome CMOS technology’s scaling limitations. However, many such devices exhibit nonmonotonic I-V characteristi...