137 search results - page 21 / 28 » Simulation methods for RF integrated circuits |
DAC
2004
ACM
14 years 8 months ago
2004
ACM
As technology advances, the metal width is decreasing with the length increasing, making the resistance along the power line increase substantially. Together with the nonlinear sc...
SECON
2010
IEEE
13 years 5 months ago
2010
IEEE
The principles of sensor networks--low-power, wireless, in-situ sensing with many inexpensive sensors--are only recently penetrating into underwater research. Acoustic communicati...
DAC
2005
ACM
14 years 8 months ago
2005
ACM
We present an efficient optimization scheme for gate sizing in the presence of process variations. Using a posynomial delay model, the delay constraints are modified to incorporat...
GLVLSI
2005
IEEE
14 years 1 months ago
2005
IEEE
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...
TVLSI
2008
13 years 7 months ago
2008
Abstract--Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact ...