The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
Udo Sobe, Karl-Heinz Rooch, Andreas Ripp, Michael ...
Hop-by-hop data aggregation is a very important technique for reducing the communication overhead and energy expenditure of sensor nodes during the process of data collection in a...
—With the advancement of CMOS manufacturing process to nano-scale, future shipped microprocessors will be increasingly vulnerable to intermittent faults. Quantitatively character...
Composability is the capability to select and assemble reusable simulation components in various combinations into simulation systems to meet user requirements. The Defense Modeli...
In this study, simulation models were developed to explore the effects of decentralization and interdependence on individuals working in research groups. We conducted the study by...
Elias Cesar Araujo De Carvalho, Jatin Shah, Anand ...