1304 search results - page 134 / 261 » Simulation of Soliton Circuits |
152
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ICCAD
1992
IEEE
15 years 10 months ago
1992
IEEE
Excessive power dissipation in integrated circuits causes overheating and can lead to soft errors and or permanent damage. The severity of the problem increases in proportion to t...
156
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JCP
2008
15 years 5 months ago
2008
Semiconductor manufacturing process scaling increases leakage and transistor variations, both of which are problematic for static random access memory (SRAM). Since SRAM is a criti...
148
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TVLSI
2008
15 years 5 months ago
2008
ion levels. The framework also supports the generation of test constraints, which can be satisfied using a constraint solver to generate tests. A compositional verification approac...
176
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VW
2000
Springer
15 years 9 months ago
2000
Springer
This article describes a 3D biomechanical simulation of a salamander to be used in experiments in computational neuroethology. The physically-based simulation represents the salama...
118
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ISCAS
2007
IEEE
16 years 3 days ago
2007
IEEE
—this paper introduces series/parallel and parallel/series composite resistor topologies. These topologies allow one to design a temperature coefficient that is insensitive to pr...