1304 search results - page 175 / 261 » Simulation of Soliton Circuits |
ISQED
2008
IEEE
14 years 3 months ago
2008
IEEE
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
ISQED
2008
IEEE
14 years 3 months ago
2008
IEEE
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
AHS
2007
IEEE
14 years 3 months ago
2007
IEEE
Rapid-prototyping of commercial devices and the demanding requirements for flexible hardware in mobile applications have driven the raise of reconfigurable hardware. The adaptatio...
DSD
2007
IEEE
14 years 3 months ago
2007
IEEE
The reduction of the cumbersome operations of multiplication, division, and powering to addition, subtraction and multiplication is what makes the Logarithmic Number System (LNS) ...
ISCAS
2007
IEEE
14 years 3 months ago
2007
IEEE
Abstract—This paper presents the design of a two-stage pseudodifferential operational transconductance amplifier (OTA). The circuit was designed in a standard 0.18 µm, 0.5 V VT ...