Various X-filling methods have been proposed for reducing the shift and/or capture power in scan testing. The main drawback of these methods is that X-filling for low power leads t...
S. Balatsouka, V. Tenentes, Xrysovalantis Kavousia...
Automated generators for synthetic models and data can play a crucial role in designing new algorithms/modelframeworks, given the sparsity of benchmark models for empirical analys...
Abstract-- In analog circuits, blocks need to be placed symmetrically to satisfy the devices matching. Different from the existing constraint-driven approaches, the proposed topolo...
As the minimum feature sizes of VLSI circuits get smaller while the clock frequency increases, the effects of process variations become significant. We propose a UST/DME based ap...
- This paper presents a novel approach for fast transient analysis of buffered hybrid structured clock networks. The new method applies structure reduction and relaxed hierarchical...
Yi Zou, Qiang Zhou, Yici Cai, Xianlong Hong, Sheld...