1119 search results - page 1 / 224 » Single View Metrology |
ICCV
1999
IEEE
15 years 23 days ago
1999
IEEE
We describe how 3D affine measurements may be computed from a single perspective view of a scene given only minimal geometric information determined from the image. This minimal i...
ICIP
2009
IEEE
14 years 9 months ago
2009
IEEE
Metric rectification has important applications to topics such as single-view metrology, camera calibration, optical character recognition and texture extraction or synthesis. This...
NPL
2010
13 years 9 months ago
2010
The existing Multi-View Learning (MVL) is to discuss how to learn from patterns with multiple information sources and has been proven its superior generalization to the usual Sing...
ICIP
2005
IEEE
15 years 15 days ago
2005
IEEE
In this paper, we describe how 3D Euclidean measurements can be made in a pair of uncalibrated images, when only minimal geometric information are available in the image planes. T...
ICCAD
1996
IEEE
14 years 3 months ago
1996
IEEE
In this paper, we propose a method to generate high quality test waveform on chip to avoid the parasitic eects in an analog testability bus test environment. For the test response...