636 search results - page 108 / 128 » Sketch Based Image Deformation |
ICCV
2009
IEEE
15 years 18 days ago
2009
IEEE
We propose a novel framework for contour based object
detection and recognition, which we formulate as a joint
contour fragment grouping and labeling problem. For a
given set of...
CEC
2010
IEEE
13 years 8 months ago
2010
IEEE
Abstract--This paper presents an approach to the task of locating a group of buildings based solely on their relative spatial relationships. This situation can occur in the problem...
ICRA
2005
IEEE
14 years 1 months ago
2005
IEEE
Abstract— Nanomanipulation using Atomic Force Microscope (AFM) has been extensively investigated for many years. However, control of tip position during nanomanipulation is still...
ECCV
2006
Springer
14 years 9 months ago
2006
Springer
We propose a fast algorithm, EMD-L1, for computing the Earth Mover's Distance (EMD) between a pair of histograms. Compared to the original formulation, EMD-L1 has a largely si...
MICCAI
2006
Springer
14 years 8 months ago
2006
Springer
Abstract. We propose a method for atrophy simulation in structural MR images based on finite-element methods, providing data for objective evaluation of atrophy measurement techniq...