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OSDI
2008
ACM
14 years 7 months ago
Disk Drive Workload Captured in Logs Collected During the Field Return Incoming Test
Hard disk drives returned back to Seagate undergo the Field Return Incoming Test. During the test, the available logs in disk drives are collected, if possible. These logs contain...
Alma Riska, Erik Riedel
TRIDENTCOM
2005
IEEE
14 years 9 days ago
A Geography-Aware Scalable Community Wireless Network Test Bed
Wireless mesh networks have increasingly become an object of interest in recent years as a strong alternative to purely wired infrastructure networks and purely mobile wireless ne...
Bow-Nan Cheng, Shivkumar Kalyanaraman, Max Klein
JUCS
2010
133views more  JUCS 2010»
13 years 5 months ago
Knowledge Authoring with ORE: Testing, Debugging and Validating Knowledge Rules in a Semantic Web Framework
Abstract: Ontology rule editing, testing, debugging and validation are still handcrafted and painful tasks. Nowadays, there is a lack of tools that take these tasks into considerat...
Andrés Muñoz Ortega, Jose M. Alcaraz...
DDECS
2007
IEEE
201views Hardware» more  DDECS 2007»
14 years 1 months ago
Built in Defect Prognosis for Embedded Memories
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskaran...
TOOLS
1997
IEEE
13 years 11 months ago
A Catalogue of General-Purpose Software Design Patterns
Software design patterns describe proven solutions to recurring software design problems. Knowledge of these patterns increases designers’ abilities, leads to cleaner and more e...
Walter F. Tichy