32 search results - page 3 / 7 » Soft-Error Tolerance Analysis and Optimization of Nanometer ... |
DDECS
2007
IEEE
14 years 2 months ago
2007
IEEE
Logic Soft Errors caused by radiation are a major concern when working with circuits that need to operate in harsh environments, such as space or avionics applications, where soft ...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
INTEGRATION
2008
13 years 7 months ago
2008
Variation is a significant concern in nanometer-scale CMOS due to manufacturing equipment being pushed to fundamental limits, particularly in lithography. In this paper, we review...
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
The scaling of CMOS technology into the nanometer era enables the fabrication of highly integrated systems, which increasingly contain analog and/or RF parts. However, scaling into...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
1 This paper presents a transient faults sensitivity evaluation for Quasi Delay Insensitive (QDI) asynchronous circuits. Because of their specific architecture, asynchronous circui...