The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
Udo Sobe, Karl-Heinz Rooch, Andreas Ripp, Michael ...
The exponential distribution is a key distribution in many event-driven Monte-Carlo simulations, where it is used to model the time between random events in the system. This paper...
Intertask/interprocess synchronization overheads may be significant in a multiprocessor-shared memory System-on-a-Chip implementation. These overheads are observed in terms of loc...
Bilge Saglam Akgul, Jaehwan Lee, Vincent John Moon...
To meet the high demand for powerful embedded processors, VLIW architectures are increasingly complex (e.g., multiple clusters), and moreover, they now run increasingly sophistica...
Experience with generating simulation data of high energy physics experiments has shown that a job monitoring system (JMS) is essential to understand failures of jobs within the G...