Semiconductor manufacturers aim at deliver new devices within shorter times in order to gain market shares. First silicon debug is an important issue in order to minimize the time...
Paolo Bernardi, Michelangelo Grosso, Maurizio Reba...
This paper presents the first implementation of Built-In Self-Test (BIST) of Field Programmable Gate Arrays (FPGAs) using a soft core embedded processor for reconfiguration of the...
TIS (Test Instruction Set) is an instruction level technique for CPU core self-testing. This method is based on enhancing a CPU instruction set with test instructions. TIS replace...
Saeed Shamshiri, Hadi Esmaeilzadeh, Zainalabedin N...
Two embedded processor based fault injection case studies are presented which are applicable to Field Programmable Gate Arrays (FPGAs) and FPGA cores in configurable System-on-Chip...
Bradley F. Dutton, Mustafa Ali, Charles E. Stroud,...