87 search results - page 9 / 18 » Space of DRAM fault models and corresponding testing |
CONSTRAINTS
2007
13 years 7 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
ICCAD
2005
IEEE
14 years 4 months ago
2005
IEEE
The presence of unknown values in the simulation result is a key barrier to effective output response compaction in practice. This paper proposes a simple circuit module, called a...
AAAI
2010
13 years 7 months ago
2010
The goal of testing is to discriminate between multiple hypotheses about a system--for example, different fault diagnoses--by applying input patterns and verifying or falsifying t...
GECCO
2004
Springer
14 years 23 days ago
2004
Springer
Abstract. The need for effective testing techniques for architectural level descriptions is widely recognised. However, due to the variety of domain-specific architectural descript...
ICRA
2009
IEEE
14 years 2 months ago
2009
IEEE
Abstract— The paper deals with computing frictional forceclosure grasps of 3D objects problem. The key idea of the presented work is the demonstration that wrenches associated to...