1599 search results - page 39 / 320 » Statistic Analysis for Probabilistic Processes |
IJCNN
2006
IEEE
14 years 3 months ago
2006
IEEE
—The measure of similarity normally utilized in statistical signal processing is based on second order moments. In this paper, we reveal the probabilistic meaning of correntropy ...
ASPDAC
2007
ACM
14 years 1 months ago
2007
ACM
With aggressive scaling down of feature sizes in VLSI fabrication, process variation has become a critical issue in designs. We show that two necessary conditions for the "Ma...
ASPDAC
2006
ACM
14 years 3 months ago
2006
ACM
Statistical timing analysis has been widely applied to predict the timing yield of VLSI circuits when process variations become significant. Existing statistical latch timing met...
ISQED
2009
IEEE
14 years 3 months ago
2009
IEEE
A system-level statistical analysis methodology is described that captures the impact of inter- and intra-die process variations for read timing failures in SRAM circuit blocks. U...
ECSQARU
2007
Springer
14 years 3 months ago
2007
Springer
Traditional Dempster Shafer belief theory does not provide a simple method for judging the effect of statistical and probabilistic data on belief functions and vice versa. This put...