—The measure of similarity normally utilized in statistical signal processing is based on second order moments. In this paper, we reveal the probabilistic meaning of correntropy ...
With aggressive scaling down of feature sizes in VLSI fabrication, process variation has become a critical issue in designs. We show that two necessary conditions for the "Ma...
Statistical timing analysis has been widely applied to predict the timing yield of VLSI circuits when process variations become significant. Existing statistical latch timing met...
A system-level statistical analysis methodology is described that captures the impact of inter- and intra-die process variations for read timing failures in SRAM circuit blocks. U...
Soner Yaldiz, Umut Arslan, Xin Li, Larry T. Pilegg...
Traditional Dempster Shafer belief theory does not provide a simple method for judging the effect of statistical and probabilistic data on belief functions and vice versa. This put...