With semiconductor fabrication technologies scaled below 100 nm, the design-manufacturing interface becomes more and more complicated. The resultant process variability causes a nu...
Alexander V. Mitev, Michael Marefat, Dongsheng Ma,...
The aim of this paper is to give a.sketch of a foundation of statistical analysis with fuzzy data, extending the methodology of Mathematical Stat,istics. For t.hispurpose it will ...
In the field of computer analysis of document images, the problems of physical and logical layout analysis have been approached through a variety of heuristic, rule-based, and gr...
Regression or least squares fitting is an important problem in statistics, data mining and many other applications. In recent years, basis functions derived from the underlying g...