— Starting at the 65nm node, stress engineering to improve performance of transistors has been a major industry focus. An intrinsic stress source – shallow trench isolation –...
Andrew B. Kahng, Puneet Sharma, Rasit Onur Topalog...
We present experimental analysis to exploit the sequence dependence on energy saving in error tolerant image processing. Our analysis shows that the error distributions depend not...
Data warehouses and OLAP systems help to interactively analyze huge volume of data. This data, extracted from transactional databases, frequently contains spatial information whic...
Sandro Bimonte, Anne Tchounikine, Maryvonne Miquel
— This paper presents non-linear precoding design in closed-loop multiple-input multiple-output (MIMO) orthogonal frequency-division multiplexing (OFDM) over spatiallycorrelated,...
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
Kewal K. Saluja, Shriram Vijayakumar, Warin Sootka...