2 search results - page 1 / 1 » Statistical Diagnosis for Intermittent Scan Chain Hold-Time ... |
105
Voted
ITC
2003
IEEE
15 years 9 months ago
2003
IEEE
Intermittent scan chain hold-time fault is discussed in this paper and a method to diagnose the faulty site in a scan chain is proposed as well. Unlike the previous scan chain dia...
113
Voted
ATS
2009
IEEE
15 years 10 months ago
2009
IEEE
Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Sca...