2 search results - page 1 / 1 » Statistical Diagnosis for Intermittent Scan Chain Hold-Time ... |
ITC
2003
IEEE
14 years 22 days ago
2003
IEEE
Intermittent scan chain hold-time fault is discussed in this paper and a method to diagnose the faulty site in a scan chain is proposed as well. Unlike the previous scan chain dia...
ATS
2009
IEEE
14 years 2 months ago
2009
IEEE
Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Sca...